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https://dspace.upt.ro/xmlui/handle/123456789/1855Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Popo, Rodion | - |
| dc.date.accessioned | 2020-05-06T18:15:40Z | - |
| dc.date.accessioned | 2021-03-01T08:37:41Z | - |
| dc.date.available | 2020-05-06T18:15:40Z | - |
| dc.date.available | 2021-03-01T08:37:41Z | - |
| dc.date.issued | 2006 | - |
| dc.identifier.citation | Popo, Rodion. Rejection of potentially defective CМОS IC. Timişoara: Editura Politehnica, 2006 | en_US |
| dc.identifier.uri | http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Rejection%20of%20potentially%20defective%20C%D0%9C%D0%9ES%20IC&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo | - |
| dc.description.abstract | In this paper, some measures of increase of operational reliability of microcircuits at stages of manufacture and operation are examined. | en_US |
| dc.language.iso | en | en_US |
| dc.publisher | Timişoara: Editura Politehnica | en_US |
| dc.relation.ispartofseries | Buletinul ştiinţific al Universităţii „Politehnica” din Timişoara, România. Seria electronică şi telecomunicaţii, Tom 51(65), fasc. 1 (2006), p. 170-173 | - |
| dc.subject | Microcircuits | en_US |
| dc.title | Rejection of potentially defective CМОS IC [articol] | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Articole științifice/Scientific articles | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| BUPT_ART_Popo_f.pdf | 404.88 kB | Adobe PDF | View/Open |
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