Simulation based testing of complex electronic systems [articol]

Abstract

Complex electronic systems[3,21] are built of different electronic devices interacting between them. The devices are interacting using one or several common buses. The testing of each device is done as a functional testing but it doesn’t prove the functioning of the hole system. Testing complex systems while simulating the environment with additional hardware could prove to be impossible. Simulating each device, assembling the system, generating the test program for the entire system and running the test while injecting errors and failures to some of the devices could be very useful for the assessment of the system reliability in time. This paper analyses the technical and the cost opportunities for the design of such a testing system.