Abstract:
In this paper two new cosine windows of 5
and 6 orders are proposed for dynamic testing of analogto-
digital converters (ADCs) by means of the energybased
method. These windows are very suited for
dynamic testing of high-resolutions ADCs (16-20 bits).
The effectiveness of each window in spectral leakage
reduction is evaluated by means of the parameter neff
defined in [1]. The frequency responses and the main
characteristics of the windows are presented. Carried
out simulations confirm the effectiveness of each
window.
