Abstract:
Threat issues in specific applications of
digital filters are investigated. Since these redundant
faults tend to appear in the same general location as testresistant
faults, the presence of many redundant faults
can hide significant untested faults despite high overall
test coverage. Classes of redundant faults that arise in
digital filters are described and we propose a suite of
technologies for identifying and eliminating the most
common redundancies based on arithmetic optimization