dc.contributor.author |
Popo, Rodion |
|
dc.date.accessioned |
2020-05-06T18:15:40Z |
|
dc.date.accessioned |
2021-03-01T08:37:41Z |
|
dc.date.available |
2020-05-06T18:15:40Z |
|
dc.date.available |
2021-03-01T08:37:41Z |
|
dc.date.issued |
2006 |
|
dc.identifier.citation |
Popo, Rodion. Rejection of potentially defective CМОS IC. Timişoara: Editura Politehnica, 2006 |
en_US |
dc.identifier.uri |
http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Rejection%20of%20potentially%20defective%20C%D0%9C%D0%9ES%20IC&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo |
|
dc.description.abstract |
In this paper, some measures of increase of operational reliability of microcircuits at stages of manufacture and operation are examined. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Timişoara: Editura Politehnica |
en_US |
dc.relation.ispartofseries |
Buletinul ştiinţific al Universităţii „Politehnica” din Timişoara, România. Seria electronică şi telecomunicaţii, Tom 51(65), fasc. 1 (2006), p. 170-173 |
|
dc.subject |
Microcircuits |
en_US |
dc.title |
Rejection of potentially defective CМОS IC [articol] |
en_US |
dc.type |
Article |
en_US |