Rejection of potentially defective CМОS IC [articol]

dc.contributor.author	Popo, Rodion
dc.date.accessioned	2020-05-06T18:15:40Z
dc.date.accessioned	2021-03-01T08:37:41Z
dc.date.available	2020-05-06T18:15:40Z
dc.date.available	2021-03-01T08:37:41Z
dc.date.issued	2006
dc.identifier.citation	Popo, Rodion. Rejection of potentially defective CМОS IC. Timişoara: Editura Politehnica, 2006	en_US
dc.identifier.uri	http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Rejection%20of%20potentially%20defective%20C%D0%9C%D0%9ES%20IC&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo
dc.description.abstract	In this paper, some measures of increase of operational reliability of microcircuits at stages of manufacture and operation are examined.	en_US
dc.language.iso	en	en_US
dc.publisher	Timişoara: Editura Politehnica	en_US
dc.relation.ispartofseries	Buletinul ştiinţific al Universităţii „Politehnica” din Timişoara, România. Seria electronică şi telecomunicaţii, Tom 51(65), fasc. 1 (2006), p. 170-173
dc.subject	Microcircuits	en_US
dc.title	Rejection of potentially defective CМОS IC [articol]	en_US
dc.type	Article	en_US