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Compensated CMOS delay cells over process, voltage and temperature variations [articol]

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dc.contributor.author Ionaşcu, Cristian
dc.contributor.author Burdia, Dănuţ
dc.contributor.author Dimitriu, Bogdan
dc.date.accessioned 2021-12-08T15:30:04Z
dc.date.available 2021-12-08T15:30:04Z
dc.date.issued 2004
dc.identifier.citation Ionaşcu, Cristian. Compensated CMOS delay cells over process, voltage and temperature variations. Timişoara: Editura Politehnica, 2004 en_US
dc.identifier.uri http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Compensated%20CMOS%20delay%20cells%20over%20process,%20voltage%20and%20temperature%20variations&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo
dc.description.abstract One of the challenges in digital systems is the distribution of the generated on-chip clock with a small uncertainty. In this paper a high performance compensated delay cell concept it is presented. It is based on a current reference, which is almost insensitive to PVT (process, voltage and temperature) variations. Using this current reference the delay value of the compensated delay cell it is nearly constant over temperature range (-55C to 125C) and voltage range (1.62V to 1.98V). Post layout simulation results shows a ratio for the value of the delay between best case corner and worst case corner smaller than 1.5. en_US
dc.language.iso en en_US
dc.publisher Timişoara : Editura Politehnica en_US
dc.relation.ispartofseries Buletinul ştiinţific al Universităţii „Politehnica” din Timişoara, România. Seria electronică şi telecomunicaţii, Tom 49(63), fasc. 1 (2004), p. 159-163
dc.title Compensated CMOS delay cells over process, voltage and temperature variations [articol] en_US
dc.type Article en_US


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