Abstract:
Throughout the PhD thesis are addressed topics of very high relevance and actuality regarding the fault tolerance of cache memories. The state of the art in cache memory testing is presented and comparisons between the state of the art and the developed methods are also presented. The first version of the Self Adaptive cache Memories technique is improved twice, obtaining even better results. Another problem that is treated in thesis is the distribution of faults inside a memory, and an original probabilistic method for error location prediction is also presented in this thesis.
