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Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Dancău, Marian Gh. | - |
dc.date.accessioned | 2023-10-23T12:29:23Z | - |
dc.date.available | 2023-10-23T12:29:23Z | - |
dc.date.issued | 1983 | - |
dc.identifier.citation | Dancău, Marian Gh.. Probleme ale testării industriale a unităţilor de memorie RAM cu circuite integrate. Timișoara: Institutul Politehnic „Traian Vuia" Timișoara, Facultatea de Electrotehnică, 1983 | en_US |
dc.identifier.uri | https://dspace.upt.ro/xmlui/handle/123456789/6035 | - |
dc.language.iso | other | en_US |
dc.publisher | Institutul Politehnic „Traian Vuia" Timișoara, Facultatea de Electrotehnică | en_US |
dc.subject | Circuite integrate | en_US |
dc.subject | Unităţi de memorie RAM | en_US |
dc.subject | Teză de doctorat | en_US |
dc.title | Probleme ale testării industriale a unităţilor de memorie RAM cu circuite integrate | en_US |
dc.type | Thesis | en_US |
Appears in Collections: | Teze de doctorat/Phd theses |
Files in This Item:
File | Description | Size | Format | |
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BUPT_TD_Dancau Marian.pdf | 17.36 MB | Adobe PDF | View/Open | |
BUPT_TD_Dancau Marian_Anexa A5_A6.pdf | 24.45 MB | Adobe PDF | View/Open |
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