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Please use this identifier to cite or link to this item: https://dspace.upt.ro/xmlui/handle/123456789/6035
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dc.contributor.authorDancău, Marian Gh.-
dc.date.accessioned2023-10-23T12:29:23Z-
dc.date.available2023-10-23T12:29:23Z-
dc.date.issued1983-
dc.identifier.citationDancău, Marian Gh.. Probleme ale testării industriale a unităţilor de memorie RAM cu circuite integrate. Timișoara: Institutul Politehnic „Traian Vuia" Timișoara, Facultatea de Electrotehnică, 1983en_US
dc.identifier.urihttps://dspace.upt.ro/xmlui/handle/123456789/6035-
dc.language.isootheren_US
dc.publisherInstitutul Politehnic „Traian Vuia" Timișoara, Facultatea de Electrotehnicăen_US
dc.subjectCircuite integrateen_US
dc.subjectUnităţi de memorie RAMen_US
dc.subjectTeză de doctoraten_US
dc.titleProbleme ale testării industriale a unităţilor de memorie RAM cu circuite integrateen_US
dc.typeThesisen_US
Appears in Collections:Teze de doctorat/Phd theses

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