Abstract:
Measures for logical network failure are
considered in paper. They are Dynamic Reliability
Indices (DRIs) and Reliability Function (RF). The DRIs
allow investigating the influence of one gate breakdown
to failure of logical network. Methods of Logical
Differential Calculus and structure function of a logical
network are used for calculation of these indices. The
RF is a probability of logical network failure and it is
calculated by special form of structure function.
Algorithms for DRIs and RF computation are proposed
in paper.