Failure analysis of logical network [articol]

Zaitseva, Elena; Pottosin, Yurj V.; Levashenko, Vitaly

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dc.contributor.author	Zaitseva, Elena
dc.contributor.author	Pottosin, Yurj V.
dc.contributor.author	Levashenko, Vitaly
dc.date.accessioned	2020-04-15T07:07:48Z
dc.date.accessioned	2021-03-01T08:37:22Z
dc.date.available	2020-04-15T07:07:48Z
dc.date.available	2021-03-01T08:37:22Z
dc.date.issued	2008
dc.identifier.citation	Zaitseva, Elena. Failure analysis of logical network. Timişoara: Editura Politehnica, 2008	en_US
dc.identifier.uri	http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Failure%20analysis%20of%20logical%20network&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo
dc.description.abstract	Measures for logical network failure are considered in paper. They are Dynamic Reliability Indices (DRIs) and Reliability Function (RF). The DRIs allow investigating the influence of one gate breakdown to failure of logical network. Methods of Logical Differential Calculus and structure function of a logical network are used for calculation of these indices. The RF is a probability of logical network failure and it is calculated by special form of structure function. Algorithms for DRIs and RF computation are proposed in paper.	en_US
dc.language.iso	en	en_US
dc.publisher	Timişoara : Editura Politehnica	en_US
dc.relation.ispartofseries	Seria electronică şi telecomunicaţii;Tom 53(67), fasc. 1 (2008)
dc.subject	Reliability analysis	en_US
dc.subject	Dynamic Reliability Indices	en_US
dc.subject	Reliability Function	en_US
dc.title	Failure analysis of logical network [articol]	en_US
dc.type	Article	en_US