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dc.contributor.authorZaitseva, Elena-
dc.contributor.authorPottosin, Yurj V.-
dc.contributor.authorLevashenko, Vitaly-
dc.date.accessioned2020-04-15T07:07:48Z-
dc.date.accessioned2021-03-01T08:37:22Z-
dc.date.available2020-04-15T07:07:48Z-
dc.date.available2021-03-01T08:37:22Z-
dc.date.issued2008-
dc.identifier.citationZaitseva, Elena. Failure analysis of logical network. Timişoara: Editura Politehnica, 2008en_US
dc.identifier.urihttp://primo.upt.ro:1701/primo-explore/search?query=any,contains,Failure%20analysis%20of%20logical%20network&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo-
dc.description.abstractMeasures for logical network failure are considered in paper. They are Dynamic Reliability Indices (DRIs) and Reliability Function (RF). The DRIs allow investigating the influence of one gate breakdown to failure of logical network. Methods of Logical Differential Calculus and structure function of a logical network are used for calculation of these indices. The RF is a probability of logical network failure and it is calculated by special form of structure function. Algorithms for DRIs and RF computation are proposed in paper.en_US
dc.language.isoenen_US
dc.publisherTimişoara : Editura Politehnicaen_US
dc.relation.ispartofseriesSeria electronică şi telecomunicaţii;Tom 53(67), fasc. 1 (2008)-
dc.subjectReliability analysisen_US
dc.subjectDynamic Reliability Indicesen_US
dc.subjectReliability Functionen_US
dc.titleFailure analysis of logical network [articol]en_US
dc.typeArticleen_US
Appears in Collections:Articole științifice/Scientific articles

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