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Title: | Failure analysis of logical network [articol] |
Authors: | Zaitseva, Elena Pottosin, Yurj V. Levashenko, Vitaly |
Subjects: | Reliability analysis Dynamic Reliability Indices Reliability Function |
Issue Date: | 2008 |
Publisher: | Timişoara : Editura Politehnica |
Citation: | Zaitseva, Elena. Failure analysis of logical network. Timişoara: Editura Politehnica, 2008 |
Series/Report no.: | Seria electronică şi telecomunicaţii;Tom 53(67), fasc. 1 (2008) |
Abstract: | Measures for logical network failure are considered in paper. They are Dynamic Reliability Indices (DRIs) and Reliability Function (RF). The DRIs allow investigating the influence of one gate breakdown to failure of logical network. Methods of Logical Differential Calculus and structure function of a logical network are used for calculation of these indices. The RF is a probability of logical network failure and it is calculated by special form of structure function. Algorithms for DRIs and RF computation are proposed in paper. |
URI: | http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Failure%20analysis%20of%20logical%20network&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo |
Appears in Collections: | Articole științifice/Scientific articles |
Files in This Item:
File | Description | Size | Format | |
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BUPT_ART_Zaitseva_f.pdf | 506.83 kB | Adobe PDF | View/Open |
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