Please use this identifier to cite or link to this item: https://dspace.upt.ro/xmlui/handle/123456789/1588
Title: Failure analysis of logical network [articol]
Authors: Zaitseva, Elena
Pottosin, Yurj V.
Levashenko, Vitaly
Subjects: Reliability analysis
Dynamic Reliability Indices
Reliability Function
Issue Date: 2008
Publisher: Timişoara : Editura Politehnica
Citation: Zaitseva, Elena. Failure analysis of logical network. Timişoara: Editura Politehnica, 2008
Series/Report no.: Seria electronică şi telecomunicaţii;Tom 53(67), fasc. 1 (2008)
Abstract: Measures for logical network failure are considered in paper. They are Dynamic Reliability Indices (DRIs) and Reliability Function (RF). The DRIs allow investigating the influence of one gate breakdown to failure of logical network. Methods of Logical Differential Calculus and structure function of a logical network are used for calculation of these indices. The RF is a probability of logical network failure and it is calculated by special form of structure function. Algorithms for DRIs and RF computation are proposed in paper.
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Appears in Collections:Articole științifice/Scientific articles

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