Please use this identifier to cite or link to this item: https://dspace.upt.ro/xmlui/handle/123456789/3755
Title: Short-circuit power evaluation of deep submicrometer CMOS gates driving lossless transmission lines [articol]
Authors: Burdia, Dănuţ
Comșa, Ciprian-Romeo
Ionaşcu, Cristian
Subjects: Submicrometer CMOS gates
Interconnections
Transmission lines
Short-circuit power dissipation
Issue Date: 2004
Publisher: Timişoara: Editura Politehnica
Citation: Burdia, Dănuţ. Short-circuit power evaluation of deep submicrometer CMOS gates driving lossless transmission lines. Timişoara: Editura Politehnica, 2004
Series/Report no.: Buletinul ştiinţific al Universităţii „Politehnica” din Timişoara, România. Seria electronică şi telecomunicaţii, Tom 49(63), fasc. 1 (2004), p. 178-183
Abstract: In this paper the short-circuit power of a CMOS gate driving a inductive - capacitive (lossless) transmission line is investigated. The case of input signal transition time smaller than twice the transmission line propagation delay is considered. Closed-form expressions for the output voltage, short-circuit power and short-circuit to dynamic power ratio are derived. Also, a formula for calculating the transistor widths for the matched condition is obtained. The nth power law MOSFET model for short-channel devices is used. The analytical results are in very good agreement with SPICE simulations.
URI: http://primo.upt.ro:1701/primo-explore/search?query=any,contains,Short-circuit%20power%20evaluation%20of%20deep%20submicrometer%20CMOS%20gates%20driving%20lossless%20transmission%20lines&tab=default_tab&search_scope=40TUT&vid=40TUT_V1&lang=ro_RO&offset=0 Link Primo
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